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Silicon Data Mining 標準化應用與商機

標準化的Si-data mining framework可以大量降低測試成本,即使面臨尖端製程的變異性也能夠在晶圓測試階段準確預測晶片將來運行(含老化)之效能。依此可以擴大至晶圓層級甚至是產線的良率與製程參數之調整,優化產品出貨並提高產能,並衍生需多新的軟硬體供應需求(SiDM IPs、SiDM資料中心、SiDM軟體)與新的設計服務模式(資料分析、晶片設計競爭力改善、Fab流程改善) [http://funbroad.tw]
by

Hock Chen

on 20 May 2014

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