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SYSTEM 8 APPLICATIONS

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WILLIAN SANTOS

on 23 September 2016

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Transcript of SYSTEM 8 APPLICATIONS

CUSTOM TEST
YOU SHOULD USE THIS TECHNIQUE TO :
Test specific component aspects quickly
Create custom tests for specific components
INSTRUMENT FEATURES
Save and share custom instruments
Integrate custom instruments to automated test sequences
What is it ?
A custom test is a test designed to verify a specific aspect of a component using a range of standard instruments available within SYSTEM 8. Custom instruments can be created and saved.

Why use it ?
Design custom tests instruments, not readily available, to speed up test times.
EPROM VERIFICATION
IC IDENTIFICATION
YOU SHOULD USE THIS TECHNIQUE TO :
Determine the reference number on an IC
Be able to test the device functionally
Find out if you can replace the IC with an equivalent
INSTRUMENT FEATURES
In and out of circuit capabilities
Only IC size needs to be specified
List of all equivalent references provided
LOGIC TEST GENERATOR
SHORT LOCATOR
What is it ?
The short locator uses a technique to precisely measure the impedance between two nodes on the PCB.

Why use it ?
Determine the impedance of a track and establish accurately the location of a short on the board.
DIGITAL FUNCTIONAL TEST
YOU SHOULD USE THIS TECHNIQUE TO :
Functionally check the IC is working :
PASS
or
FAIL
Check the IC is wired correctly : open and short circuits, links
Check the IC is powered correctly : individual pin voltages
INSTRUMENT FEATURES
Auto-clip positioning (place test clip in any orientation)
Logic trace (view logic test patterns of inputs and outputs)
Loop testing with false loop and true loop (intermittent faults)
Suitable for DIL, SOIC, PLCC, QFP and Russian packages
What is it ?
The digital functional test uses an internal test program from a library of devices to verify the functionality of the device in-circuit with power on. This is also known as the truth table test.

Why use it ?

Check that the IC performs its function correctly as wired i.e without removing it from the board. The system monitors the IC connections and adjusts the signals for safe testing.
MATRIX V-I ANALYSIS
INSTRUMENT FEATURES
Store results and compare with another device
Comparison percentage visible with adjustable tolerance
Frequency, voltage, impedance, waveform adjustable
Out-of-circuit option with adapter
YOU SHOULD USE THIS TECHNIQUE TO :
Check the correct component is fitted
Check for catastrophic failures: device broken internally
Compare one device with another
Test a damaged board: no need to apply power or ground
SIGNATURE ANALYSIS (V-I)
INSTRUMENTS FEATURES
Save testing time by using clips instead of test probes
Store results for later comparison
Comparison percentage visible with adjustable tolerance
Frequency, voltage, impedance, waveform adjustable
YOU SHOULD USE THIS TECHNIQUE TO :
Test a heavily damaged board: no need to apply power
Check for catastrophic failures: device broken internally
Compare one device with another: using store function
Check for consistency and find damaged devices around DUT
What is it ?

Using the GND as reference, this power off test measures the current response of the pins of an IC when subjected to a variable (AC) voltage. The results are plotted as a Voltage / Current graph (V-I) and produce a signature. This signature is directly related to the nature of the device and its internal structure.

Why use it ?
Determine if the device is damaged without applying power to the board.
DISCRETE FUNCTIONAL TEST
INSTRUMENT FEATURES
Auto-clip positioning (
place test clip in any orientation
)
Loop testing with false loop and true loop (
intermittent faults
)
Standard test programs for generic devices (
if part number is unknown
)
Suitable for DIL and SOIC packages
What is it ?
The discrete functional test uses an internal test program from the system library to verify in-circuit the functionality of the device.

Why use it ?
Check that the device performs its function as wired i.e without removing it from the board.
ANALOGUE FUNCTIONAL TEST
INSTRUMENT FEATURES
Auto-clip positioning (place test clip in any orientation)
Loop testing with false loop and true loop (intermittent faults)
Standard test programs for generic devices (if P/N is unknown)
Suitable for DIL and SOIC packages
YOU SHOULD USE THIS TECHNIQUE TO :
Functionally check the IC is working :
PASS
or
FAIL
Check the IC is wired correctly: open and short circuits, links
Check the IC is powered correctly: individual pin voltages
Review functional results: analysis window
What is it ?
The analogue functional test uses an internal test program from a library of devices to verify the functionality of the device in-circuit with power on.

Why use it ?

Check that the IC performs its function correctly as wired i.e without removing it from the board. The system monitors the IC connections and adjusts the signals for safe testing.
SIGNAL COMPARISON TEST
INSTRUMENT FEATURES
Automatic measurements
Adjustable parameters in arbitrary function generator
Automatic frequency sweep
Integrate custom instruments to automated test sequences
YOU SHOULD USE THIS TECHNIQUE TO :
Observe amplitude variations in signals
Check for phase shifting through components
Check for frequency changes in components
Check component response to frequency range
What is it ?
A signal comparison test happens when a waveform is generated and injected into a pin or test point on the board. The signal on the output of a component can be monitored for variations.

Why use it ?
Check the component response when submitted to a variable signal.
YOU SHOULD USE THIS TECHNIQUE TO :
Ensure the IC is connected properly : broken/shorted tracks
Check that the IC is internally undamaged
Test an unknown device: no knowledge required
IC CHECK
INSTRUMENT FEATURES
Adjustable voltage for analogue signatures
Loop modes available
Can be used at board level through connectors
Suitable for DIL, SOIC, PLCC, QFP and Russian devices
What is it ?
IC check allows for the connection and voltage configuration as well as thermal readings and analogue signatures to be displayed from any logic device and compares them with known good data or another similar IC.

Why use it ?

Compare with another board to check for connection variations or internal damages on the IC.
SIGNAL ANALYSIS
INSTRUMENT FEATURES
Customisable instruments (allows the design of an instrument as per required)
Comparison tool graph (check quickly if the signal is within tolerance)
Calculator (manipulate live data using mathematical equations)
Data logging
YOU SHOULD USE THIS TECHNIQUE TO :
Check the validity of a signal: clock signal or current value
Check the value of a component: resistance
Check component receives accurate supply
What is it ?
Signal analysis uses a range of high specification industrial instrumentation available in virtual mode to acquire data from the PCB or component under test quantifying the results with power on or off.

Why use it ?

To check the values and specifications of components on the board.
BOARD LEVEL TEST
INSTRUMENT FEATURES
Up to 2,048 channels
Channels configurable as drive, measure and VI.
Easy to set up
Store results to compare with other boards
YOU SHOULD USE THIS TECHNIQUE TO :
Test a board but not each component
Locate the area of a fault quickly
Run loop tests to exercise the board
DYNAMIC SEMICONDUCTOR TEST
YOU SHOULD USE THIS TECHNIQUE TO :
Check the activation of a gate-activated device
Check the level of activation: device activates at the right voltage
DISCRETE SIGNATURE ANALYSIS (V-I)
INSTRUMENT FEATURES
3D/2D live comparison (compare two PCBs at the same time)
Store results for later comparison
Comparison percentage visible with adjustable tolerance
Frequency, voltage, impedance, waveform adjustable
YOU SHOULD USE THIS TECHNIQUE TO :
Test a heavily damaged board safely: no need to apply power
Check the correct component is fitted: wrong value
Check for catastrophic failures: devices broken internally
Compare one device with another: no knowledge of component required
What is it ?
Discrete signature analysis is a power off test that measures the current response of a device when subjected to a variable (AC) voltage. The results are plotted as a Voltage / Current graph (V-I) and produce a signature. This signature is directly related to the nature of the device and its internal structure.

Why use it ?
Determine if a component is damaged without applying power to the board.
What is ?
SYSTEM 8 is a range of modules dedicated to the test, measurement, fault finding and repair of both analogue and digital electronics, at component or board level.

The modular nature of SYSTEM 8 means that your equipment can be customised to meet
YOUR
needs and requirements.
LOGIC TEST GENERATOR
Generate logic test vectors to
functionally test digital ICs

DYNAMIC SEMICONDUCTOR TEST
Test gate-activated devices
in V-T mode

POWER SUPPLY
Apply power to the PCB and
check current consumption

EPROM VERIFICATION
Read and verify the contents of
EPROM devices

IC IDENTIFICATION
Identify unknown and house coded ICs in-circuit

IC CHECK
Check connections and V-I curves

SHORT LOCATOR
Check shorted or high
impedance tracks

SIGNAL ANALYSIS
Acquire and measure signals
with virtual instrumentation

DISCRETE FUNCTIONAL TEST
Check functionality of discrete components in-circuit
with test program

DISCRETE SIGNATURE ANALYSIS (V-I)
Detect leaky or incorrect capacitors and diodes

DIGITAL FUNCTIONAL TEST
Check the IC functionality
in-circuit with test program

BOARD LEVEL

TEST
Drive and check voltages or check
V-I curves for the complete PCB

SIGNATURE ANALYSIS (V-I)
Check for IC integrity IN-CIRCUIT
with a power off V-I curve

ANALOGUE FUNCTIONAL TEST
Check the IC functionality In Circuit
with a test program

CUSTOM

TEST
Utilise the system's unique features to develop and run custom tests

MATRIX VI ANALYSIS
Analyse in-depth digital and analogue ICs and check for damage

SIGNAL COMPARISON TEST
Input a signal to a device and check the response at other locations

POWER SUPPLY
YOU SHOULD USE THIS TECHNIQUE TO
:
Safely power up PCBs
Check the power consumption of a PCB
Avoid further power-on tests to be done until high current consumption is fixed
INSTRUMENTS FEATURES
Over voltage trip on logic supply
Current limiter available
Programmable max allowed current consumption with
PASS
or
FAIL
indication
Fully customisable instrument
What is it ?

The EPROM verifier reads the content of an EPROM and returns the values of the file along with a checksum.

Why use it ?
Check that all EPROMs on a batch of similar boards contain the same or any information.
What is it ?
The IC identifier runs an automatic test algorithm capable of determining the function of a good working but unknown digital device. The user is shown a list of equivalent ICs that are already in the library. Any part number displayed at this stage can be used to functionally test the unknown IC.

Why use it ?
To determine the equivalent part number of a device that is illegible or unknown.
What is it ?

The power supply offers logic as well as negative and positive outputs. Fully customisable, it also offers the ability to set maximum/safe current consumption values per output and indicate
PASS
or
FAIL
to warn the user in case there are shorts present on the PCB under test.

Why use it ?

The power supply is integral to the SYSTEM 8 range and can be included in automated test sequences (TestFlow).
What is it ?
Matrix V-I is a power off test that measures the current response of a device when subjected to a variable (AC) voltage. It uses each pin of the device (in turn) as the voltage reference instead of using ground. The results are plotted as a Voltage / Current graph (V-I) and produce a set of signatures.

Why use it ?
Determine in details if a device is internally damaged without applying power to the board.
INSTRUMENT FEATURES
Positive and negative adjustable pulse amplitude
Pulse timing adjustable
Store results to compare with other devices
Frequency, voltage, impedance, waveform adjustable
What is it ?
A dynamic semiconductor test checks that a gate-activated device (triac, transistor, SCR etc…) is activating properly. The test applies a variable voltage (sine wave) between two nodes of the device and sends a voltage pulse to the trigger pin. When the device activates, the signal becomes shorted and forms a “notch” on the sine wave.
HOW CAN YOU TEST OR REPAIR THIS PCB USING ?
BOARD LEVEL

TEST V-I
Check and compare
V-I curves for complete PCBs

BOARD LEVEL TEST V-I
INSTRUMENT FEATURES
Up to 2,048 channels
V-I with frequency sweep (3D)
Easy to set up
Store results to compare with other boards
YOU SHOULD USE THIS TECHNIQUE TO :
Check the PCB integrity before powering it up
Test the whole PCB instead of each component
Locate the faulty sector area of a fault quickly
YOU SHOULD USE THIS TECHNIQUE TO :
Test a custom IC graphically
Test part of the functionality of a device
Test complete digital PCB assemblies
INSTRUMENT FEATURES
Auto-learn function
Variable output drive levels
Variable threshold levels
Visual indication of failure
What is it ?

The logic test generator uses a combination of logic sequences (known as test vectors) to drive the inputs of a digital IC or PCB and automatically measure the response patterns from the outputs.

Why use it ?
Generate your own test sequences for custom ICs or complete PCB assemblies.
INSTRUMENT FEATURES
In and out of circuit capabilities
Save file to computer
YOU SHOULD USE THIS TECHNIQUE TO :
· Read the content of an EPROM
· Verify the content of an EPROM against a known file
· Check that an EPROM is not blank
What is it ?
A board level test is a combination of power off (analogue signature analysis) and power on (voltages) checks at PCB level. The board is considered to be a complete unit with inputs and outputs. Contacts can be made through connectors or using a test fixture (bed of nails).

Why use it ?
To test at board level that the PCB is functioning correctly.
What is it ?
The V-I test can be a starting point to check the integrity of the PCB under test without applying power. The board is considered to be a complete unit with inputs and outputs. Contacts can be made through connectors or using a test fixture (bed of nails).

Why use it ?
To test at board level that the PCB free from faults such as shorts and broken tracks without powering it up.
LOGIC TEST GENERATOR
Generate logic test vectors to functionally test digital ICs

YOU SHOULD USE THIS TECHNIQUE TO :
Functionally check that the device is working:
PASS
or
FAIL
Check the device is wired correctly: open/short circuits, links
Determine the pin out of the device: emitter, collector etc.
Review functional results: analysis windows
Why use it ?
Test the dynamic activation of a device without applying power to the board.
Power ON TEST
Power OFF TEST
YOU SHOULD USE THIS TECHNIQUE TO :
Determine the location of short: solder bridge for example
Determine the power rails of an IC: between Vcc/Gnd and a pin
Check continuity between two points : ensure track is not damaged
INSTRUMENTS FEATURES
Variable audible tone depending on proximity to short
Impedance measurement
Three Ohm ranges available
For more information, visit
www.abielectronics.co.uk

Copyright 2015
ABI Electronics
Dodworth Business Park
S75 3SP - Barnsley
United Kingdom
+44 1226 207420
sales@abielectronics.co.uk
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